Comparison of SVM and ANN for classification of eye events in EEG

Rajesh Singla, Brijil Chambayil, Arun Khosla, Jayashree Santosh

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DOI: 10.4236/jbise.2011.41008                

Abstract

The eye events (eye blink, eyes close and eyes open) are usually considered as biological artifacts in the electroencephalographic (EEG) signal. One can con-trol his or her eye blink by proper training and hence can be used as a control signal in Brain Computer Interface (BCI) applications. Support vector ma-chines (SVM) in recent years proved to be the best classification tool. A comparison of SVM with the Artificial Neural Network (ANN) always provides fruitful results. A one-against-all SVM and a multi-layer ANN is trained to detect the eye events. A com-parison of both is made in this paper.

Keywords

ANN; BCI; EEG; Eye Event; Kurtosis; SVM

Conflicts of Interest

The authors declare no conflicts of interest.

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