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Microstructure and Dielectric Properties of PZS-PLZT Ceramics System

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DOI: 10.4236/msa.2013.48058    4,001 Downloads   6,054 Views   Citations


Piezoelectric ceramics are an important class of solid-state materials as they exhibit a wide range of applications. This article investigates the sintering temperature effect on microstructure and dielectric properties of a new ceramics material Pb (Zn, Sb) O3-PbLa (Zr, Ti) O3 (PZS-PLZT), which was prepared by a solid mixed-oxide solution method. Scanning electron micrograph (SEM) and X-ray diffraction (XRD) techniques was employed to examine the crystallization of the ceramics. The results of XRD show that the phase structure of the samples is tetragonal. The lattice parameters and the density increased with increase of the sintering temperature. The dielectric constant and the dielectric loss of the investigated samples decreased with increase in the frequency.

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The authors declare no conflicts of interest.

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S. Adel and B. Ahmed, "Microstructure and Dielectric Properties of PZS-PLZT Ceramics System," Materials Sciences and Applications, Vol. 4 No. 8, 2013, pp. 478-482. doi: 10.4236/msa.2013.48058.


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