Measurement of Film Thickness on a Curved Surface by Fiber Optic Probe

C. Buffone, A. Glushchuk, C. S. Iorio, F. Dubois

Microgravity Research Centre, Universitè Libre de Bruxelles, Bruxelles, Belgium.

DOI: 10.4236/jectc.2013.31003                

Abstract

A fiber optic sensor is developed in order to measure film thickness along a curved surface. The technique is non-invasive, which has large bandwidth and good spatial resolution (150 μm and 300 μm). A “finger” type surface is used on top of which liquid is poured down in a continuing manner. Film thickness is measured with the fiber optic probe on 2 different locations along the “finger” surface. Film thickness of 163 and 79 μm was measured near the top and in the middle of the fin surface.

Keywords

Fiber Optic; “Finger” Surface; Condensation

Conflicts of Interest

The authors declare no conflicts of interest.

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