Author(s)

Emmanuel Nanéma^1,2*, Moustapha Konaté², Frédéric Ouattara²

¹Centre National de la Recherche Scientifique et Technologique (CNRST), Institut de Recherche en Sciences Appliquées et Technologies (IRSAT), Ouagadougou, Burkina Faso.
²Université Norbert ZONGO, Laboratoire de Recherche en Météorologie de l’Espace (LAREME), Koudougou, Burkina Faso.

This study deals with Peak of electron density in F2-layer sensibility scale during quiet time on solar minimum. Peaks of electron density in F2-layer (NmF2) values at the quietest days are compared to those carried out from the two nearest days (previous and following of quietest day). The study uses International Reference Ionosphere (IRI) for ionosphere modeling. The located station is Ouagadougou, in West Africa. Solar minimum of phase 22 is considered in this study. Using three core principles of ionosphere modeling under IRI running conditions, the study enables to carry out Peak of electron density in F2-layer values during the quietest days of the characteristic months for the four different seasons. These parameters are compared to those of the previous and the following of the quietest days (the day before and following each quietest selected day) at the same hour. The knowledge of NmF2 values at the quietest days and at the two nearest days enables to calculate the relative error that can be made on this parameter. This calculation highlights insignificant relative errors. This means that NmF2 values at the two nearest days of each quietest day on solar minimum can be used for simulating the quietest days’ behavior. NmF2 values obtained by running IRI model have good correlation with those carried out by Thermosphere-Ionosphere-Electrodynamics-General Circulation Model (TIEGCM).

Ionosphere, Peak of Electron Density in F2-Layer, Solar Cycle, Quiet Day, International Reference Ionosphere Model

Nanéma, E. , Konaté, M. and Ouattara, F. (2019) Peak of Electron Density in F2-Layer Parameters Variability at Quiet Days on Solar Minimum. Journal of Modern Physics, 10, 302-309. doi: 10.4236/jmp.2019.103021.