Identification of Molecular Markers Linked to Leaf Rust Resistance Genes in Wheat and Their Detection in the Local Near-Isogenic Line - American Journal of Plant Sciences

AJPS > Vol.2 No.3, September 2011

Volume 2, Issue 3 (September 2011)

ISSN Print: 2158-2742 ISSN Online: 2158-2750

Google-based Impact Factor: 1.20 Citations h5-index & Ranking

Identification of Molecular Markers Linked to Leaf Rust Resistance Genes in Wheat and Their Detection in the Local Near-Isogenic Line ()

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Download as PDF (Size: 188KB) PP. 433-437

DOI: 10.4236/ajps.2011.23049 5,385 Downloads 10,738 Views Citations

Author(s)

Navjot Kaur Dhillon, Harcharan Singh Dhaliwal

Affiliation(s)

ABSTRACT

Sixty-five random amplified polymorphic DNA (RAPD) primers were used for the detection of polymorphism among recipient and donor parents and their isogenic lines linked to leaf rust resistance genes, Lr9 and the resistant gene in kharchia local mutant KLM4-3B. Three primers showed polymorphism among recurrent parent, donor parent and isogenic lines.

KEYWORDS

RAPD, Lr9, Isogenic Lines

Share and Cite:

Dhillon, N. and Dhaliwal, H. (2011) Identification of Molecular Markers Linked to Leaf Rust Resistance Genes in Wheat and Their Detection in the Local Near-Isogenic Line. American Journal of Plant Sciences, 2, 433-437. doi: 10.4236/ajps.2011.23049.

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