Journal of Surface Engineered Materials and Advanced Technology

Volume 1, Issue 2 (July 2011)

ISSN Print: 2161-4881   ISSN Online: 2161-489X

Google-based Impact Factor: 0.29  Citations  

The Optical Parameters of ZnxCd(1-x)Te Chalcogenide Thin Films

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DOI: 10.4236/jsemat.2011.12008    3,749 Downloads   7,877 Views  Citations

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ABSTRACT

A procedure to make optical quality thin films of ZnxCd(1-x) Te by use of thermal evaporation of the ternary compound has been investigated. Structural and optical properties of ZnxCd(1-x)Te solid solution with x = 0.1 to 0.5 were synthesized, from the resulting ZnTe and CdTe composition used in preparation of thin films. Structural investigation indicates they have polycrystalline structure. Composition was confirmed from EDAX while SEM picture shows homogeneity in films. Plots of (αhν)2 versus (hν) yield straight line indicating direct transition occurs with optical band gap energies in the range 1.7 - 2.3 eV. It is also found with increase Zn content the band gap of the films increases. Refractive indices and extinction coefficients have been evaluated in the spectral range (200 - 2500 nm).

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Khairnar, U. , Behere, S. and Pawar, P. (2011) The Optical Parameters of ZnxCd(1-x)Te Chalcogenide Thin Films. Journal of Surface Engineered Materials and Advanced Technology, 1, 51-55. doi: 10.4236/jsemat.2011.12008.

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