Engineering

Volume 16, Issue 5 (May 2024)

ISSN Print: 1947-3931   ISSN Online: 1947-394X

Google-based Impact Factor: 0.66  Citations  

XPS Studies on Electroless As-Deposited and Annealed Ni-P Films

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DOI: 10.4236/eng.2024.165010    33 Downloads   87 Views  

ABSTRACT

Electroless deposition has been used to deposit Ni-P films on glass slides using the reducing agent sodium hypophosphite. This has been done with a purpose to use Ni-P films as back contact for silicon carbide radiation detectors. By keeping deposition time, temperature, pH and concentration of the precursor solution constant, the film deposition has been done. XPS studies were done to analyze the composition and stoichiometry of Ni-P thin films.

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Chowdhury, T. (2024) XPS Studies on Electroless As-Deposited and Annealed Ni-P Films. Engineering, 16, 123-133. doi: 10.4236/eng.2024.165010.

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