Focused-Ion-Beam Induced Paramagnetic Defects in FAMn:PbI3 Perovskite Films - Advances in Chemical Engineering and Science

ACES > Vol.12 No.2, April 2022

Advances in Chemical Engineering and Science

Volume 12, Issue 2 (April 2022)

ISSN Print: 2160-0392 ISSN Online: 2160-0406

Google-based Impact Factor: 1.41 Citations h5-index & Ranking

Focused-Ion-Beam Induced Paramagnetic Defects in FAMn:PbI3 Perovskite Films ()

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DOI: 10.4236/aces.2022.122007 170 Downloads 786 Views Citations

Author(s)

Nam Joong Jeon¹, Jangwon Seo^1*, Yanghee Kim², Ji Yeong Lee², Sugyeong Hong³, Sun Hee Kim³, Jung-Keun Lee^4*

Affiliation(s)

¹Division of Advanced Materials, Korea Research Institute of Chemical Technology, Daejeon, Korea.
²Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, Korea.
³Western Seoul Center, Korea Basic Science Institute, Seoul, Korea.
⁴Physics Department, Division of Liberal Arts & Sciences, Hanil University & PTS, Wanju, Korea.

ABSTRACT

FAMn:PbI₃ perovskite films were synthesized and probed mainly through electron spin resonance (ESR) spectroscopy. FAMn:PbI₃ with low (~1%) Mn concentration showed a hyperfine sextet line originated from Mn⁺⁺ ions. FAMn:PbI₃ with high (10%) Mn concentration showed broad resonance (~500 G peak-to-peak linewidth). However, after bombardment of FAMn:PbI₃ with high Mn concentration by focused ion beams (FIB), a sharp ESR peak appeared. The peak-to-peak linewidth (ΔH_pp) was ~8 G regardless of the temperature. The FIB-induced defect showed Curie behavior at low temperatures (5 K - 50 K), which indicates the presence of localized electrons at the defect sites at low temperatures. The g-value increased from g = 2.0002 to 2.0016 as the temperature increased from 5 K to 50 K. Together with the ongoing search for electron spin echo (ESE), this could potentially provide a platform for realizing magnetic bits, information storage, and increased manipulation speed.

KEYWORDS

Perovskite Manganites, FIB, Paramagnetic Spins

Share and Cite:

Jeon, N. , Seo, J. , Kim, Y. , Lee, J. , Hong, S. , Kim, S. and Lee, J. (2022) Focused-Ion-Beam Induced Paramagnetic Defects in FAMn:PbI3 Perovskite Films. Advances in Chemical Engineering and Science, 12, 87-95. doi: 10.4236/aces.2022.122007.

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