|
[1]
|
Meander-Type Transmission Line Design for On-Wafer TRL Calibration up to 330 GHz
2020 50th European Microwave Conference (EuMC),
2021
DOI:10.23919/EuMC48046.2021.9338177
|
|
|
|
|
[2]
|
Investigation of Variation in On-Si On-Wafer TRL Calibration in Sub-THz
IEEE Transactions on Semiconductor Manufacturing,
2021
DOI:10.1109/TSM.2021.3073486
|
|
|
|
|
[3]
|
Meander-Type Lines: An Innovative Design for On-Wafer TRL Calibration for mmW and Sub-mmW Frequencies Measurements
IEEE Transactions on Terahertz Science and Technology,
2021
DOI:10.1109/TTHZ.2021.3059337
|
|
|
|
|
[4]
|
Silicon Test Structures Design for Sub-THz and THz Measurements
IEEE Transactions on Electron Devices,
2020
DOI:10.1109/TED.2020.3031575
|
|
|
|
|
[5]
|
On the Application of Schottky Contacts in the Microwave, Extremely High Frequency, and THz Ranges
Semiconductors,
2019
DOI:10.1134/S1063782619160280
|
|
|
|
|
[6]
|
Efecto de hongos formadores de micorrizas arbusculares en clones de Coffea arabica, variedad caturra en Perú
Acta Agronómica,
2019
DOI:10.15446/acag.v68n4.72117
|
|
|
|
|
[7]
|
An investigation of the DC and RF performance of InP DHBTs transferred to RF CMOS wafer substrate
Journal of Semiconductors,
2018
DOI:10.1088/1674-4926/39/5/054004
|
|
|
|
|
[8]
|
Importance of complete characterization setup on on-wafer TRL calibration in sub-THz range
2018 IEEE International Conference on Microelectronic Test Structures (ICMTS),
2018
DOI:10.1109/ICMTS.2018.8383798
|
|
|
|
|
[9]
|
A test structure set for on-wafer 3D-TRL calibration
2016 International Conference on Microelectronic Test Structures (ICMTS),
2016
DOI:10.1109/ICMTS.2016.7476182
|
|
|
|
|
[10]
|
Meander type transmission line design for on-wafer TRL calibration
2016 46th European Microwave Conference (EuMC),
2016
DOI:10.1109/EuMC.2016.7824358
|
|
|
|