has been cited by the following article(s):
[1]
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Excellent Reliability and High-Speed Antiferroelectric HfZrO2 Tunnel Junction by a High-Pressure Annealing Process and Built-In Bias Engineering
ACS Applied Materials & Interfaces,
2020
DOI:10.1021/acsami.0c15091
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[2]
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Excellent Reliability and High-Speed Antiferroelectric HfZrO2 Tunnel Junction by a High-Pressure Annealing Process and Built-In Bias Engineering
ACS Applied Materials & Interfaces,
2020
DOI:10.1021/acsami.0c15091
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