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Journal of Electromagnetic Analysis and Applications

Journal of Electromagnetic Analysis and Applications

Journal of Electromagnetic Analysis and Applications

ISSN Print: 1942-0730
ISSN Online: 1942-0749
www.scirp.org/journal/jemaa
E-mail: jemaa@scirp.org
"A Simple Analytic Approximation for the Refracted Field at Gaussian Beam Incidence upon a Boundary of Absorbing Medium"
written by Vladimir M. Serdyuk, Joseph A. Titovitsky,
published by Journal of Electromagnetic Analysis and Applications, Vol.2 No.11, 2010
has been cited by the following article(s):
  • Google Scholar
  • CrossRef
[1] Approximate analytical model of the refracted field of the Gaussian light beam on a plane dielectric interface
Optics Communications, 2023
[2] Optimization of highly inclined illumination for diffraction-limited and super-resolution microscopy
Optics …, 2023
[3] Пространственная структура преломленного поля гауссова светового пучка при полном внутреннем отражении
2023
[4] Spatial structure of the refracted field of a Gaussian light beam at total internal reflection
JOSA A, 2022
[5] Theory of Gaussian beam diffraction by a transmission dielectric grating
Progress In Electromagnetics Research B, 2021
[6] Microscopie à fluorescence sélective et volumétrique pour la localisation de molécules uniques dans des environnements encombrés
2021
[7] Enhancement of inclined optical sheet illumination and its application to quantitative super-resolution microscopy
2020
[8] Steering Flexural Waves by Amplitude-Shift Elastic Metasurfaces
2020
[9] Enhanced 4Pi single-molecule localization microscopy with coherent pupil based localization and light sheet illumination
2019
[10] Efficiency of Gaussian light beam transformation into a waveguide mode of a plane dielectric layer under frustrated total internal reflection
2019
[11] Refractive index determination for a plane dielectric layer using the measurements of transmitted beam intensity
2017
[12] ОПРЕДЕЛЕНИЕ ПОКАЗАТЕЛЯ ПРЕЛОМЛЕНИЯ ПЛОСКОГО ДИЭЛЕКТРИЧЕСКОГО СЛОЯ МЕТОДОМ ИЗМЕРЕНИЯ ИНТЕНСИВНОСТЕЙ …
2017
[13] Определение показателя преломления плоского диэлектрического слоя методом измерения интенсивностей проходящих пучков
2017
[14] Approximate analytical solution for waveguide excitation of a plane dielectric layer by a Gaussian beam at frustrated total internal reflection
JOSA A, 2015
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