System-on-Chip Test Data Compression Based on Split-Data Variable Length (SDV) Code

ISSN Print: 2153-1285
ISSN Online: 2153-1293
www.scirp.org/journal/cs
E-mail: cs@scirp.org

Citations

"System-on-Chip Test Data Compression Based on Split-Data Variable Length (SDV) Code"
written by J. Robert Theivadas, V. Ranganathan, J. Raja Paul Perinbam,
published by Circuits and Systems, Vol.7 No.8, 2016

has been cited by the following article(s):

[1]	Variable-to-Variable Run Length Encoding Technique for Testing Low Power VLSI Circuits
	Melange, 2019

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