has been cited by the following article(s):
[1]
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VI-characteristics and transient analysis of an EEPROM device
2023 7th International Conference on Trends in Electronics and Informatics (ICOEI),
2023
DOI:10.1109/ICOEI56765.2023.10125983
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[2]
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EEPROM endurance degradation at different temperatures: State of the art TCAD simulation
Microelectronics Reliability,
2022
DOI:10.1016/j.microrel.2022.114717
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[3]
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EEPROM endurance degradation at different temperatures: State of the art TCAD simulation
Microelectronics Reliability,
2022
DOI:10.1016/j.microrel.2022.114717
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[4]
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EEPROM endurance degradation at different temperatures: State of the art TCAD simulation
Microelectronics Reliability,
2022
DOI:10.1016/j.microrel.2022.114717
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[5]
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An Overview on Nonvolatile Memories Used in Automotive Industry
2021 International Conference on Electromechanical and Energy Systems (SIELMEN),
2021
DOI:10.1109/SIELMEN53755.2021.9600442
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