Silicon Nanocrystals on the Surface of Standard Si Wafers: A Micro-Raman Investigation

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ISSN Print: 2327-6045
ISSN Online: 2327-6053

Website: https://www.scirp.org/journal/msce
E-mail: msce@scirp.org

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Submission

"Silicon Nanocrystals on the Surface of Standard Si Wafers: A Micro-Raman Investigation"
written by Mohammed S. G. Mohammed, Enzo Cazzanelli, Angela Fasanella, Marco Castriota,
published by Journal of Materials Science and Chemical Engineering, Vol.6 No.7, 2018

has been cited by the following article(s):

[1]	Trimming of silicon-on-insulator ring-resonators via localized laser annealing
	2020

[2]	Enhanced Surface Properties of Light-Trapping Si Nanowires Using Synergetic Effects of Metal-Assisted and Anisotropic Chemical Etchings
	2019