has been cited by the following article(s):
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[1]
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Sensing of streptococcus mutans by microscopic imaging ellipsometry
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2017 |
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[2]
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基于玻璃基底的透明导电金膜的光学性质
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东华大学学报: 自然科学版,
2016 |
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[3]
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Characterization of PVK Polymeric Material Using Rotating Polarizer and Analyzer Ellipsometer with a Speed Ratio 1
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2016 |
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[4]
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Laser Encapsulation of Organic Electronics with Adapted Diode Lasers in Flexible Production Processes
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Physics Procedia,
2016 |
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[5]
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Research Article Characterization of PVK Polymeric Material Using Rotating Polarizer and Analyzer Ellipsometer with a Speed Ratio 1: 1 Anas A. Alkanoo …
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2016 |
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[6]
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Research Article Characterization of PVK Polymeric Material Using Rotating Polarizer and Analyzer Ellipsometer with a Speed Ratio 1: 1 Anas A. Alkanoo …
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2016 |
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[7]
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Research Article Characterization of PVK Polymeric Material Using Rotating Polarizer and Analyzer Ellipsometer with a Speed Ratio 1: 1 Anas A. Alkanoo Department …
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2016 |
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[8]
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Design of a spectroscopic ellipsometer by synchronous rotation of the polarizer and analyzer in opposite directions
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Microwave and Optical Technology Letters,
2014 |
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[9]
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Effect of the orientation of the fixed analyzer on the ellipsometric parameters in rotating polarizer and compensator ellipsometer with speed ratio 1: 1
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Optical and Quantum Electronics,
2014 |
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[10]
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Rotating polarizer, compensator, and analyzer ellipsometry
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Chinese Physics B,
2013 |
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[11]
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Reflection, transmission and ellipsometric parameters of the multilayer structure using a bi-characteristic-impedance transmission line approach
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Optica Applicata,
2013 |
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[12]
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Rotating polarizer analyzer ellipsometer with a fixed compensator
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Optik-International Journal for Light and Electron Optics,
2013 |
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[13]
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A spectroscopic ellipsometer using rotating polarizer and analyzer at a speed ratio 1: 1 and a compensator
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Optical and Quantum Electronics,
2013 |
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[14]
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Reflection, transmission, and ellipsometric parameters of the multilayer structure using a bi-characteristic-impedance transmission line approach
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2013 |
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[15]
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Reflection, transmission and ellipsometric parameters of the multilayer structure using a bi-characteristic-impedance transmission line approach.
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Optica Applicata,
2013 |
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[16]
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Theoritical Characterization of Different Samples Using Rotating Polarizer and Analyzer Ellipsometer with A Fixed Compensator
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2012 |
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[17]
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To my dear parents. To my wife. To my sisters and brothers To my homeland Palestine the only place in which I feel alive.
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NULL
2012 |
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[18]
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Ellipsometric configurations using a phase retarder and a rotating polarizer and analyzer at any speed ratio
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Chinese Physics B,
2012 |
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[19]
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Effect of noise on the optical parameters extracted from different ellipsometric configurations
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Physica Scripta,
2012 |
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[1]
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Sensing of Streptococcus mutans by microscopic imaging ellipsometry
Journal of Biomedical Optics,
2017
DOI:10.1117/1.JBO.22.5.056005
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[2]
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Laser Encapsulation of Organic Electronics with Adapted Diode Lasers in Flexible Production Processes
Physics Procedia,
2016
DOI:10.1016/j.phpro.2016.08.013
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[3]
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Ellipsometric configurations using a phase retarder and a rotating polarizer and analyzer at any speed ratio
Chinese Physics B,
2012
DOI:10.1088/1674-1056/21/11/110701
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