has been cited by the following article(s):
[1]
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Optimizing RFSOI Performance through a T-shaped Gate and Nano-Second Laser Annealing Techniques
2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
2023
DOI:10.1109/RFIC54547.2023.10186137
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[2]
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An accurate model for predicting high frequency noise of nanoscale NMOS SOI transistors
Solid-State Electronics,
2017
DOI:10.1016/j.sse.2017.02.005
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[3]
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An accurate model for predicting high frequency noise of nanoscale NMOS SOI transistors
Solid-State Electronics,
2017
DOI:10.1016/j.sse.2017.02.005
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