Journal of Modern Physics

Journal of Modern Physics

ISSN Print: 2153-1196
ISSN Online: 2153-120X
www.scirp.org/journal/jmp
E-mail: jmp@scirp.org
"Extendibility Evaluation of Industrial EUV Source Technologies for kW Average Power and 6.x nm Wavelength Operation"
written by Akira Endo,
published by Journal of Modern Physics, Vol.5 No.5, 2014
has been cited by the following article(s):
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[1] Surface morphology change of protective film on collector mirror related to implantation of Sn emitted from laser produced plasma in EUV light source
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[2] EUV Sources
Handbook of Laser Micro …, 2020
[3] Laser-Produced Plasma Sources for High-Volume-Manufacturing EUV Lithography
2019
[4] Case Studies: Technology Innovations Driven by Moore's Law
2018
[5] Extending Moore's law through advanced semiconductor design and processing techniques
2018
[6] Photolithography Enhancements
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[7] Light sources for high-volume manufacturing EUV lithography: technology, performance, and power scaling
Advanced Optical Technologies, 2017
[8] Free-electron laser emission architecture impact on EUV lithography
2017
[9] kW-class picosecond thin-disc prepulse laser Perla for efficient EUV generation
Journal of Micro/Nanolithography, MEMS, and MOEMS, 2017
[10] Advances in High-Power, Ultrashort Pulse DPSSL Technologies at HiLASE
Applied Sciences, 2017
[11] Free-electron laser emission architecture impact on extreme ultraviolet lithography
Journal of Micro/Nanolithography, MEMS, and MOEMS, 2017
[12] EUV Free-Electron Laser Requirements for Semiconductor Manufacturing
Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, 2016
[13] Theory: electron-induced chemistry
Materials and Processes for Next Generation Lithography, 2016
[14] Development and Metrology of Extreme Ultraviolet and soft X-ray Multilayer Mirrors
2016
[15] Considerations for a free-electron laser-based extreme-ultraviolet lithography program
SPIE Advanced Lithography, 2015
[16] Status and Potential of Laser based EUV Sources
CLEO: Applications and Technology, 2015
[17] Spectroscopy of highly charged ions and its relevance to EUV and soft x-ray source development
Journal of Physics B: Atomic, Molecular and Optical Physics, 2015
[18] Suppression of Surface Crystallization in Amorphous Tio2 Protective Film on Collector Mirror for Lifetime Elongation of Extreme Ultraviolet Light Source
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