World Journal of Nano Science and Engineering

World Journal of Nano Science and Engineering

ISSN Print: 2161-4954
ISSN Online: 2161-4962
www.scirp.org/journal/wjnse
E-mail: wjnse@scirp.org
"Threshold Voltage Sensitivity to Metal Gate Work-Function Based Performance Evaluation of Double-Gate n-FinFET Structures for LSTP Technology"
written by M. Mustafa, Tawseef A. Bhat, M. R. Beigh,
published by World Journal of Nano Science and Engineering, Vol.3 No.1, 2013
has been cited by the following article(s):
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