Advances in Materials Physics and Chemistry

Advances in Materials Physics and Chemistry

ISSN Print: 2162-531X
ISSN Online: 2162-5328
www.scirp.org/journal/ampc
E-mail: ampc@scirp.org
"Thickness Dependence of Dielectric Characteristics of SrTiO3 Thin Films on MgAl2O4 Substrates"
written by Ryuhei Kinjo, Iwao Kawayama, Hironaru Murakami, Masayoshi Tonouchi,
published by Advances in Materials Physics and Chemistry, Vol.3 No.1, 2013
has been cited by the following article(s):
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[3] Pour obtenir le grade de Docteur de l'Université de VALENCIENNES ET DU HAINAUT-CAMBRESIS
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[4] Effect of in-plane tensile strain in (100)/(001)-oriented epitaxial PbTiO3 films on their phase transition temperature and tetragonal distortion
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[5] Terahertz ellipsometry study of the soft mode behavior in ultrathin SrTiO3 films
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[6] Caractérisations diélectriques très large bande de films minces ferroélectriques de BaxSr (1-x) TiO3 pour des applications de reconfigurabilité de dispositifs hyperfréquences
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[7] Understanding Electrically Active Interface Formation on Wide Bandgap Semiconductors through Molecular Beam Epitaxy: Integration of oriented Fe3O4 …
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[8] Understanding Electrically Active Interface Formation on Wide Bandgap Semiconductors through Molecular Beam Epitaxy: Integration of oriented Fe3O4 …
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[9] Understanding Electrically Active Interface Formation on Wide Bandgap Semiconductors through Molecular Beam Epitaxy: Integration of oriented Fe3O4 for …
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[10] Understanding Electrically Active Interface Formation on Wide Bandgap Semiconductors through Molecular Beam Epitaxy: Integration of oriented Fe3O4 for next-generation spintronic devices
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[11] Caractérisations diélectriques très large bande de films minces ferroélectriques de BaxSr (1-x) TiO3 pour des applications de reconfigurabilité de dispositifs …
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