Applied Mathematics

Applied Mathematics

ISSN Print: 2152-7385
ISSN Online: 2152-7393
www.scirp.org/journal/am
E-mail: am@scirp.org
"On Robustness of a Sequential Test for Scale Parameter of Gamma and Exponential Distributions"
written by Parameshwar V. Pandit, Nagaraj V. Gudaganavar,
published by Applied Mathematics, Vol.1 No.4, 2010
has been cited by the following article(s):
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