The Effect of Deposition Temperature of Pb(Zr,Ti)O<sub>3</sub>(PZT)Thin Films with Thicknesses of around 100 nm on the Piezoelectric Response for Nano Storage Applications

ISSN Print: 2160-6919
ISSN Online: 2160-6927
www.scirp.org/journal/wjcmp
E-mail: wjcmp@scirp.org

"The Effect of Deposition Temperature of Pb(Zr,Ti)O₃(PZT)Thin Films with Thicknesses of around 100 nm on the Piezoelectric Response for Nano Storage Applications"
written by Wook Song Han,
published by World Journal of Condensed Matter Physics, Vol.2 No.2, 2012

has been cited by the following article(s):

[1]	Preparation technology of 3–3 composite piezoelectric material and its influence on performance
	2021

[2]	Epitaxial growth of full range of compositions of (1 1 1) PbZr1-xTixO3 on GaN
	2020

[3]	Correlation of electrical characteristics with interface chemistry and structure in Pt/Ru/PbZr0.52Ti0.48O3/Pt capacitors after post metallization annealing
	2018

[4]	Comparison of the thermal degradation of heavily Nb-doped and normal PZT thin films
	2017

[5]	PENGARUH KECEPATAN PUTAR DEPOSISI TERHADAP STRUKTUR KRISTAL, KETEBALAN DAN MORFOLOGI LAPISAN TIPIS TIMBAL ZIRKONAT TITANAT (PZT) …
	2016

[6]	Fabrication and Characterization of Flexible PZT Fiber and Composite
	Ferroelectrics. Taylor & Francis, 2012

[1]	PbOx phase separation in PbZr0.52Ti0.48O3 based capacitors made using sol-gel films with high Pb precursor excess Applied Physics Letters, 2022 DOI:10.1063/5.0090016

[2]	Epitaxial growth of full range of compositions of (1 1 1) PbZr1-Ti O3 on GaN Journal of Crystal Growth, 2020 DOI:10.1016/j.jcrysgro.2020.125620

[3]	Preparation technology of 3–3 composite piezoelectric material and its influence on performance Journal of Alloys and Compounds, 2020 DOI:10.1016/j.jallcom.2020.158137

[4]	Correlation of electrical characteristics with interface chemistry and structure in Pt/Ru/PbZr0.52Ti0.48O3/Pt capacitors after post metallization annealing Applied Physics Letters, 2018 DOI:10.1063/1.5041767

[5]	Comparison of the Thermal Degradation of Heavily Nb-Doped and Normal PZT Thin Films IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, 2017 DOI:10.1109/TUFFC.2017.2647971