Functional Confirmation Using a Medical X-Ray System of a Semiconductor Survey Meter

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ISSN Print: 2164-3024
ISSN Online: 2164-3032
www.scirp.org/journal/ojrad
E-mail: OJRad@scirp.org

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"Functional Confirmation Using a Medical X-Ray System of a Semiconductor Survey Meter"
written by Katsunao Suzuki, Toru Negishi, Yoh Kato, Yasuhisa Kono, Michiharu Sekimoto,
published by Open Journal of Radiology, Vol.14 No.1, 2024

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