has been cited by the following article(s):
[1]
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The Research of Reliability Measures of Thin Film Resistors on an Extended Temperature Range of Operation
2023 International Russian Automation Conference (RusAutoCon),
2023
DOI:10.1109/RusAutoCon58002.2023.10272915
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[2]
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The effect of microstructures on the electrical properties of Cr–Si–C thin film resistors
Japanese Journal of Applied Physics,
2022
DOI:10.35848/1347-4065/ac6218
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[3]
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Optimal modelling of planar thermal converter device
2017 International Semiconductor Conference (CAS),
2017
DOI:10.1109/SMICND.2017.8101205
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