New Method of Determining the Landau Levels in Narrow-Gap Semiconductors

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Open Journal of Applied Sciences

ISSN Print: 2165-3917
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"New Method of Determining the Landau Levels in Narrow-Gap Semiconductors"
written by G. Gulyamov, U. I. Erkaboev, G. N. Majidova, M. O. Qosimova, A. B. Davlatov,
published by Open Journal of Applied Sciences, Vol.5 No.12, 2015

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