Atomic Force Microscopy Studies on GaAs/In Bilayers Deposited on Si (100)

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Microscopy Research

ISSN Print: 2329-3306
ISSN Online: 2329-3314
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"Atomic Force Microscopy Studies on GaAs/In Bilayers Deposited on Si (100)"
written by Miguel Ángel Venegas, Roberto Bernal- Correa, Máximo López- López, Álvaro Pulzara- Mora,
published by Microscopy Research, Vol.3 No.1, 2015

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