New Approach for Limited-Angle Problems in Electron Microscope Based on Compressed Sensing

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ISSN Print: 1947-3931
ISSN Online: 1947-394X
www.scirp.org/journal/eng
E-mail: eng@scirp.org

"New Approach for Limited-Angle Problems in Electron Microscope Based on Compressed Sensing"
written by Marc Vila Oliva, Hamed Hamid Muhammed,
published by Engineering, Vol.5 No.10B, 2013

has been cited by the following article(s):

[1]	Tomographic phase microscopy: principles and applications in bioimaging
	Journal of the Optical Society of America B, 2017

[2]	Oblique Angle Artifact Reduction Using Wavelet-Based Filtering in Off-Centered Circular Geometry of Cone Beam Computed Tomography
	Optomechatronic Technologies (ISOT), 2014 International Symposium on, 2014

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