Detailed Micro Raman Spectroscopy Analysis of Doped Silicon Thin Film Layers and Its Feasibility for Heterojunction Silicon Wafer Solar Cells

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Journal of Materials Science and Chemical Engineering

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ISSN Online: 2327-6053
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"Detailed Micro Raman Spectroscopy Analysis of Doped Silicon Thin Film Layers and Its Feasibility for Heterojunction Silicon Wafer Solar Cells"
written by Z. P. Ling, J. Ge, R. Stangl, A. G. Aberle, T. Mueller,
published by Journal of Materials Science and Chemical Engineering, Vol.1 No.5A, 2013

has been cited by the following article(s):

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[3]	Investigations on a-Si: H thin film solar cells by RF-PECVD Materials Today: Proceedings, 2018 DOI:10.1016/j.matpr.2018.06.500

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[6]	Depth-Sensitive Raman Investigation of Metal-Oxide-Semiconductor Structures: Absorption as a Tool for Variation of Exciting Light Penetration Depth Journal of Spectroscopy, 2016 DOI:10.1155/2016/1617063

[7]	Improvement in Front-Contact Resistance and Interface Passivation of Heterojunction Amorphous/Crystalline Silicon Solar Cell by Hydrogen-Diluted Stacked Emitter IEEE Journal of Photovoltaics, 2016 DOI:10.1109/JPHOTOV.2016.2553779

[8]	High-Performance Flexible Thin-Film Transistors Based on Single-Crystal-like Silicon Epitaxially Grown on Metal Tape by Roll-to-Roll Continuous Deposition Process ACS Applied Materials & Interfaces, 2016 DOI:10.1021/acsami.6b06770

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[10]	Doped Layer Optimization for Silicon Heterojunctions by Injection-Level-Dependent Open-Circuit Voltage Measurements IEEE Journal of Photovoltaics, 2014 DOI:10.1109/JPHOTOV.2013.2294757

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