Circuits and Systems

Circuits and Systems

ISSN Print: 2153-1285
ISSN Online: 2153-1293
www.scirp.org/journal/cs
E-mail: cs@scirp.org
"Influence of Extended Bias Stress on the Electrical Parameters of Mixed Oxide Thin Film Transistors"
written by Winnie P. Mathews, Rajitha N. P. Vemuri, Terry L. Alford,
published by Circuits and Systems, Vol.3 No.4, 2012
has been cited by the following article(s):
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