Characterisation of Zinc Oxynitride Thin Films Prepared Using Zinc(II) Complex of Hexamethylenetetramine as the Precursor

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ISSN Print: 2153-117X
ISSN Online: 2153-1188
www.scirp.org/journal/msa
E-mail: msa@scirp.org

"Characterisation of Zinc Oxynitride Thin Films Prepared Using Zinc(II) Complex of Hexamethylenetetramine as the Precursor"
written by Olumide Oluwole Akinwunmi, Oluwaseun Philip Adelabu, Adetokunbo Temitope Famojuro, Olakunle A. Akinwumi, Priscilla Oluwatumilara Olaopa, Kehinde Folorunso Olafisan, Ezekiel Oladele Bolarinwa Ajayi,
published by Materials Sciences and Applications, Vol.13 No.8, 2022

has been cited by the following article(s):

[1]	Band Gap Tuning of DC Reactively Sputtered ZnON Thin Films
	arXiv preprint arXiv:2302.08201, 2023

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[1]	DC reactive sputtering of ZnON thin films: band gap engineering and associated evolution of microstructures Materials Research Express, 2024 DOI:10.1088/2053-1591/ad1e0f