Impact Thickness on Structural and Electrical Characterization of Nickel Phthalocyanine Thin Films - Advances in Materials Physics and Chemistry

AMPC > Vol.9 No.7, July 2019

Impact Thickness on Structural and Electrical Characterization of Nickel Phthalocyanine Thin Films ()

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Download as PDF (Size: 821KB) PP. 123-132

DOI: 10.4236/ampc.2019.97010 586 Downloads 1,466 Views Citations

Author(s)

Eman M. Nasir¹, Mohammed T. Hussein¹, Addnan H. Al-Aarajiy²

Affiliation(s)

¹Department of Physics, College of Science, University of Baghdad, Baghdad, Iraq.
²Department of Physics, College of Science, University of Babylon, Babylon, Iraq.

ABSTRACT

Thin films of Nickel Phthalocyanine have been prepared by evaporation technique for (50 - 350 nm) of thickness. XRD studies show that the thin films have single crystalline structure for low thicknesses with (100) orientation and the crystallite size increased with increased thickness. Also from the AFM technique for NiPc films, the roughness was determined and the grain size increases with increasing of thickness from except at thickness 350 nm. The studies of electrical properties, morphology and orientations of the crystallites are important to understand and predict the nature of the films and essential for their successful applications in solar cell and sensors. The electrical properties of these films were studied with different thickness, NiPc has three activation energy. Carrier’s concentration and mobility was calculated. Hall measurements showed that all the films are p-type.

KEYWORDS

Nickel Phthalocyanine, Vacuum Evaporation, XRD, AFM, Morphology, Thin Film, Electrical Properties

Share and Cite:

Nasir, E. , Hussein, M. and Al-Aarajiy, A. (2019) Impact Thickness on Structural and Electrical Characterization of Nickel Phthalocyanine Thin Films. Advances in Materials Physics and Chemistry, 9, 123-132. doi: 10.4236/ampc.2019.97010.

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