Author(s)

T. Uma Devi, N. Lawrence, R. Ramesh Babu, K. Ramamurthi, G. Bhagavannarayana

Crystal Growth and Thin Film Laboratory, School of Physics, Bharathidasan University,Tiruchirappalli –620024, India..
Department of Physics, Government Arts College for Women, Pudukkottaii –622001, India..
Department of Physics, St. Joseph’s College (Autonomous), Tiruchirappalli –620002, India..
Materials Characterization Division, National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi-110 012, India.

Single crystal of an organic nonlinear optical (NLO) material, Glycine picrate (GP), was grown by slow cooling method. The structural perfection of the grown crystal was analyzed by highresolution X-ray diffraction (rocking curve) measurements. UV-Visible-NIR spectral analysis was used to determine the optical constants and band gap of GP. The nature of variation of dielectric constant with frequency at different temperatures was investigated. Third-order optical nonlinearities of GP crystal were investigated. Etch patterns of the grown crystal quality were studied.

X-ray diffraction, Growth from solutions, Single crystal growth, Nonlinear optic materials

T. Devi, N. Lawrence, R. Babu, K. Ramamurthi and G. Bhagavannarayana, "Structural, Electrical and Optical Characterization Studies on Glycine Picrate Single Crystal : A Third Order Nonlinear Optical Material," Journal of Minerals and Materials Characterization and Engineering, Vol. 8 No. 10, 2009, pp. 755-763. doi: 10.4236/jmmce.2009.810065.