Special Issue on X-Ray Diffraction
X-Ray Diffraction is one of the most important
characterization tools used in solid state chemistry and materials science. It
relies on the dual wave/particle nature of X-rays to obtain information about the
crystalline materials, such as structures, phases, preferred crystal
orientations, and other structural parameters including average grain size,
crystallinity, strain, and crystal defects. We can determine the size and the
shape of the unit cell for any compound and biological molecule most easily
using X-ray diffraction. This special issue will be focused on studying
different kinds of X-ray diffraction and
their applications.
In this
special issue, we intend to invite front-line researchers and authors to submit
original research and review articles on exploring X-ray
diffraction. Potential topics include, but are not limited
to:
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Single crystal diffraction
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Powder X-ray diffraction
-
Protein crystallography
-
X-ray techniques
-
X-ray crystallography
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Instruments and approaches of X-ray diffraction
-
Applications of X-ray diffraction
Authors
should read over the journal’s For Authors carefully before submission. Prospective
authors should submit an electronic copy of their complete manuscript through
the journal’s Paper Submission System.
Please
kindly notice that the “Special Issue” under your manuscript title is
supposed to be specified and the research field “Special Issue - X-Ray Diffraction” should be chosen during your submission.
According to the
following timetable:
Submission Deadline
|
December 24th, 2014
|
Publication Date
|
February 2015
|
Guest
Editor:
For further questions or inquiries
Please contact Editorial Assistant at
ajac@scirp.org