Special Issue on

Measurement and Control Technology and Instrument

Measurement and Control Technology and Instrument studies acquisition and processing of information. It is the source of information science and technology, is theory and technology of controlling the related factors and is a new and high technology intensive integrated program which is formed by the integration of optics, precision machinery, electronics, electric power, automatic control, signal processing, computer and information technology. The goal of this special issue is to provide a platform for scientists and academics all over the world to promote, share and discuss various new issues and developments in Measurement and Control Technology and Instrument.

In this special issue, we invite front-line researchers and authors to submit original research and review articles that explore Measurement and Control Technology and Instrument. In this special issue, potential topics include, but are not limited to:

• Electronics, signal processing
• Measurements and control
• Embedded systems
• Intelligent measurement and control system and instrument
• Microprocessor and embedded system design
• Process control engineering
• Precision mechanical design

Authors should read over the journal’s For Authors carefully before submission. Prospective authors should submit an electronic copy of their complete manuscript through the journal’s Paper Submission System.

Please kindly specify the “Special Issue” under your manuscript title. The research field “Special Issue - Measurement and Control Technology and Instrument” should be selected during your submission.

Special Issue timetable:

Guest Editor:

For further questions or inquiries

Please contact the Editorial Assistant at

wjet@scirp.org