Prof. Hitoshi Habuka
Yokohama National University, Japan
Professor
Email: habuka1@ynu.ac.jp
Qualifications
1996 Ph.D., Engineering, Hiroshima University
1981 M.A., Science, Kyoto University
1979 B.A., Science, Niigata University
Publications (selected)
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"Rate Theory of Multicomponent Adsorption of Organic Species on Silicon Wafer Surface", Journal of Electrochemical Society, 2000, 147, 2319-2323 (with Manabu Shimada and Kikuo Okuyama).
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"Molecular Interaction Radii and Rate Constants for Clarifying Organic Compound Physisorption on Silicon Surface", Journal of Electrochemical Society, 2010, 157, H1014-H1018 (with Tatsuhito Naito and Norihiro Kawahara).
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"Silicon Epitaxial Growth Rate and Transport Phenomena in a Vertical Stacked-Type Multi-Wafer Reactor", Japanese Journal of Applied Physics, 2012, 51, 026701-1-5(with Masaki Tsuji).
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"Density and Behavior of Etch Pits on C-Face 4H-SiC Surface Produced by ClF3 Gas", 2012, 717-720, 379-382 (with Kazuchika Furukawa, Toshimitsu Kanai, and Tomohisa Kato).
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"Numerical Evaluation for Single Wafer Wet Etching Rate of Silicon Dioxide Film Using Hydrogen Fluoride Aqueous Solution", Materials Science in Semiconductor Processing, 2012, 15, 543-548 (with Shintaro Ohashi and Tetsuo Kinoshita).
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"Density of Etch Pits on C-Face 4H-SiC Surface Produced by ClF3 Gas", Materials Science Forum, 2012, 725, 49-52 (with Kazuchika Furukawa, Toshimitsu Kanai, and Tomohisa Kato).
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"Concentration of Three Organic Compounds Influencing Each Other on Silicon Surface", Solid State Phenomena, 2012, 187, 303-306 (with Tatsuhito Naito, a and Norihiro Kawahara) [Impact factor: 0.399 (2012)].
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"Langasite Crystal Microbalance Used for In-Situ Monitoring of Amorphous Silicon Carbide Film Deposition", ECS Journal of Solid State Science and Technology, 2012, 1, 62-65, (with Yurie Tanaka).
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"Amorphous Silicon Carbide Film Formation at Room Temperature by Monomethylsilane Gas", Materials Science Forum, 2013, 740-742, 235-238 (with Masaki Tsuji).
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"In-Situ Monitoring of Chemical Vapor Deposition from Trichlorosilane Gas and Monomethylsilane Gas Using Langasite Crystal Microbalance", Journal of Surface Engineered Materials and Advanced Technology, 2013, 3, 61-66 (with Yurie Tanaka).
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"Crystalline Defects in Silicon Wafer Caused by Prolonged High-Temperature Annealing in Nitrogen Atmosphere", Advanced Materials Research, 2013, 699, 445-449 (with Haruo Nakazawa, Masaaki Ogino, Hideaki Teranishi, and Yoshikazu Takahashi).
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"Amorphous Silicon Carbide Chemical Vapor Deposition on Metal Surface Using Monomethylsilane Gas at Low Temperatures", Surface and Coating Technology, 2013, 217, 88-93 (with Masaki Tsuji).
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"Precipitates Caused by Prolonged High-Temperature Annealing in Floating Zone Silicon Wafer Grown from Czochralski Single-Crystal Rod", Materials Science in Semiconductor Processing, 2013, 16, 923–927 (with Haruo Nakazawa, Masaaki Ogino, Hideaki Teranishi, and Yoshikazu Takahashi).
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"Surface Chemical Reaction Model of Silicon Dioxide Film Etching by Dilute Hydrogen Fluoride Using a Single Wafer Wet Etcher", 2013, ECS J. Solid State Science and Technology, 2, 264-267 (with Kosuke Mizuno, Shintaro Ohashi, and Tetsuo Kinoshita).
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"Silicon chemical vapor deposition process using a half-inch silicon wafer for Minimal Manufacturing System", Physics Procedia, 2013, 46C, 230-238 (with Ning Li, Shin-ichi Ikeda and Shiro Hara).
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"Molecular Adsorption and Desorption Behavior on Silicon Surface in a Complex Ambient Atmosphere Containing Vapors of Diethylphthalate, Acetic Acid and Water", American Journal of Analytical Chemistry, 2013, 4, 80-85 (with Nobutaka Ono, Ayumi Sakurai and Tatsuhito Naito).
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"Off-Orientation Influence on C-face (0001) 4H-SiC Surface Morphology Produced by Etching using Chlorine Trifluoride Gas", ECS Journal of Solid State Science and Technology, 2013, 2, N3025-N3027 (with Yusuke Fukumoto and Tomohisa Kato).
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"Langasite Crystal Microbalance Frequency Behavior over Wide Gas Phase Conditions for Chemical Vapor Deposition", Surface and Coatings Technology, 2013, 230, 312-315 (with Misako Matsui).
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"Cleaning Process Applicable to Silicon Carbide Chemical Vapor Deposition Reactor", ECS Journal of Solid State Science and Technology, 2014, 3, N3006-N3009 (with Yusuke Fukumoto, Kosuke Mizuno, Yuuki Ishida and Toshiyuki Ohno).
Profile Details
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