Biography

Dr. Gulmurza Abdurakhmanov

Institute of Power Engineering and Automation of the Academy of Sciences of Uzbekistan, Uzbekistan

Research Scientist


Email: gulmirzo@mail.ru


Qualifications

1981 Ph.D., Saratov State University, Russia, Physics and Mathematics

1970 M.Sc., Saratov State University, Russia, Physics


Publications (Selected)

  1. Dynamical characteristics of inhomogeneous semiconductor and dielectric structures //Tashkent, "Fan" Publishing House, 1975.
  2. Electromagnetic Interactions in the Electron-Hole Plasmas //Tashkent, "Fan" Publishing House, 1977.
  3. High temperature anomalies in Resistivity and Thermoelectric Power of Thick Film Resistors //Phys. Stat. Sol.(a) 202, No. 9, (2005) 1799 –1802.
  4. Diffusion and electrical conduction in thick film resistors //Technical Physics. The Russian Journal of Applied Physics v. 65, #7, 1995, 178-181.
  5. High temperature X-ray investigation of RuO2 powders and RuO2 thick film resistors //Fall Meeting of the MRS, Pittsburg, USA, 28 November-2 December 1994.
  6. Diffusion of RuO2 and PbRuO3 into Lead Silicate Glasses //Fall Meeting of the Materials Research Society (MRS), Boston, USA, 27 November-1 December 1995.
  7. Interaction of RuO2 and lead-silicate glass in thick-film resistors //World J. Condensed Matter Physics 1 (2011) 1-5.
  8. Structure transitions in nanocrystals, thermopower and electrical conduction of doped lead-silicate glasses //E-MRS/MRS 2011 Bilateral Meeting, Simposium ZZ, Nice (France) May 9-13, 2011.
  9. Nanocrystals, model of energy bands, conduction and thermopower of lead-silicate glasses doped by ruthenium dioxide//E-MRS/MRS 2011 Bilateral Meeting, Simposium U, Nice (France) May 9-13, 2011.
  10. Effect of Glass Composition on the Thermal Expansion of Relict Crystals of RuO2 in Doped Lead-Silicate Glasses (Thick Film Resistors) //J. Modern Phys. 2 (2011) #7, 651-653.
  11. On the conduction mechanism of silicate glass doped by oxide compounds of ruthenium (thick film resistors): Diffusion and percolation levels //World J. Condensed Matter Physics 1 (2011), 19-23.
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