Characterization of Nanorod Structure Using Spectroscopic Ellipsometry (Articles)

N. E. J. Omaghali

Optics and Photonics Journal Vol.6 No.4，April 21, 2016

DOI: 10.4236/opj.2016.64007   2,054 Downloads  2,630 Views  Citations

Ellipsometric Study of SiOx Thin Films by Thermal Evaporation (Articles)

David Salazar, Roberto Soto-Molina, Eder German Lizarraga-Medina, Marco Antonio Felix, Nicola Radnev, Heriberto Márquez

Open Journal of Inorganic Chemistry Vol.6 No.3，July 5, 2016

DOI: 10.4236/ojic.2016.63013   2,213 Downloads  3,104 Views  Citations
This article belongs to the Special Issue on Silicon materials

Optical Constants for MBE n-Type GaAs Films Doped by Si or Te between 1.50-4.75 eV (Articles)

Svetlana N. Svitasheva

Journal of Electromagnetic Analysis and Applications Vol.2 No.6，June 30, 2010

DOI: 10.4236/jemaa.2010.26046   6,805 Downloads  12,043 Views  Citations

Error Corrected Sub-Monolayer Ellipsometry for Measurement of Biomolecular Interactions (Articles)

Udo Riss

Open Journal of Biophysics Vol.3 No.1A，February 27, 2013

DOI: 10.4236/ojbiphy.2013.31A010   3,061 Downloads  5,531 Views  Citations
This article belongs to the Special Issue on Instrumental Methods and Techniques in Medicinal Physics and Biophysics

Optical Band Gap, Oxidation Polarizability, Optical Basicity and Electronegativity Measurements of Silicate Glasses Using Ellipsometer and Abbe Refractometer (Articles)

Zahid Hussain

New Journal of Glass and Ceramics Vol.11 No.1，January 8, 2021

DOI: 10.4236/njgc.2021.111001   58 Downloads  211 Views  Citations

Thin Film Characterization Using Rotating Polarizer Analyzer Ellipsometer with a Speed Ratio 1:3 (Articles)

Sofyan A. Taya, Taher M. El-Agez, Anas A. Alkanoo

Journal of Electromagnetic Analysis and Applications Vol.3 No.9，September 28, 2011

DOI: 10.4236/jemaa.2011.39056   4,258 Downloads  7,075 Views  Citations

Monolayers Langmuir-Blodgett Films of Synthetic Artificial Mimic Molecules That Resemble the Following Tetraether Lipids on Silicon Wafers (Articles)

Sri Vidawati, Ulrich Rothe

Advances in Biological Chemistry Vol.5 No.4，June 17, 2015

DOI: 10.4236/abc.2015.54015   4,633 Downloads  5,532 Views  Citations

Spectroscopic Ellipsometry Study of the Dielectric Function of Cu(In_1–xGa_x)₃Se₅ Bulk Compounds: Identification of Optical Transitions (Articles)

Dayane Habib, Georges El Haj Moussa

World Journal of Condensed Matter Physics Vol.7 No.4，November 21, 2017

DOI: 10.4236/wjcmp.2017.74009   551 Downloads  807 Views  Citations

Identification of Optical Transitions by Spectroscopic Ellipsometry (SE) on CuIn₃Se₅ Bulk Compounds (Articles)

Dayane Habib, Georges El Haj Moussa

World Journal of Condensed Matter Physics Vol.7 No.4，November 24, 2017

DOI: 10.4236/wjcmp.2017.74010   701 Downloads  1,134 Views  Citations

Modelling of Photovoltaic Modules Optical Losses Due to Saharan Dust Deposition in Dakar, Senegal, West Africa (Articles)

Dialo Diop, Mamadou Simina Drame, Moussa Diallo, David Malec, Dominique Mary, Philippe Guillot

Smart Grid and Renewable Energy Vol.11 No.7，July 31, 2020

DOI: 10.4236/sgre.2020.117007   207 Downloads  467 Views  Citations

Application of Optical Methods in Blood Studies upon Evaluation of Severity Rate of Diffuse Liver Pathology (Articles)

Margarita Kruchinina, Mikhail Voevoda, Sergey Peltek, Svetlana Kurilovich, Abdrey Gromov, Vladimir Kruchinin, Sergey Rykhlitsky, Vladimir Volodin, Vladimir Generalov

Journal of Analytical Sciences, Methods and Instrumentation Vol.3 No.2，June 11, 2013

DOI: 10.4236/jasmi.2013.32014   3,209 Downloads  5,472 Views  Citations