has been cited by the following article(s):
[1]
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Response Properties of Silicon Trench Photodiodes to Single α- and γ-Ray in Pulse Mode
IEEE Access,
2022
DOI:10.1109/ACCESS.2022.3177624
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[2]
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Response Properties of Silicon Trench Photodiodes to Single α- and γ-Ray in Pulse Mode
IEEE Access,
2022
DOI:10.1109/ACCESS.2022.3177624
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[3]
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Drift-diffusion model of hole migration in diamond crystals via states of valence and acceptor bands
Journal of Physics Communications,
2018
DOI:10.1088/2399-6528/aa8e26
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[4]
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Quasi-Classical Model of the Static Electrical Conductivity of Heavily Doped Degenerate Semiconductors at Low Temperatures
Semiconductors,
2018
DOI:10.1134/S1063782618060192
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[5]
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The charge carrier capture–emission process – the main source of the low-frequency noise in homogeneous semiconductors
Lithuanian Journal of Physics,
2017
DOI:10.3952/physics.v56i4.3416
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[6]
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Nature of low-frequency noise in homogeneous semiconductors
Scientific Reports,
2016
DOI:10.1038/srep18305
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[7]
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Nature of low-frequency noise in homogeneous semiconductors
Scientific Reports,
2015
DOI:10.1038/srep18305
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