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J. Hass, R. Feng, J. E. Millan-Otoya, X. Li, M. Sprinkle, P. N. First, W. A. de Heer, E. H. Conrad and C. Berger, “Structural Properties of the Multilayer Graphene/4H-Si (000-1) System as Determined by Surface X-Ray Diffrac- tion,” Physical Review B, Vol. 75, No. 21, 2007, Article ID: 214109. doi:10.1103/PhysRevB.75.214109

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