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V. Detalle, R. Heon, M. Sabsabi and L. St-Onge, “An Evaluation of A Commercial Echelle Spectrometer with Intensified Charge-Coupled Device Detector for Materials Analysis by Laser-Induced Plasma Spectroscopy,” Spectrochimica Acta Part B, Vol. 56, No. 6, 2001, pp. 1011-1025. doi:10.1016/S0584-8547(01)00174-4

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