Article citationsMore>>

H. Nagai, S. Takashima, M. Hiramatsu, M. Hori and T. Goto, “Behavior of Atomic Radicals and Their Effects on Organic Low Dielectric Constant Film Etching in High Density N2/H2 and N2/NH3 Plasmas,” Journal of Applied Physic, Vol. 91, No. 5, 2002, pp. 2615-2621. doi:10.1063/1.1435825

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top