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J.-P. Raskin, G. Pailloncy, D. Lederer, F. Danneville, G. Dambrine, S. Decoutere, A. Mercha and B. Parvais, “High-Frequency Noise Performance of 60-nm Gate-Length FinFETs,” IEEE Transactions on Electron Devices, Vol. 55, No. 10, 2008, pp. 2718-2727.
doi:10.1109/TED.2008.2003097
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