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Wojcieszak, D., Domaradzki, J., Kaczmarek, D. and Michalec, B. (2008) Characterization of Thin Films Based on TiO2 by XRD, AFM and XPS Measurements. 2008 International Students and Young Scientists Workshop—Photonics and Microsystems, Wroclaw-Szklarska Poreba, 20-22 June 2008, 96-99.
https://doi.org/10.1109/STYSW.2008.5164154

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