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Yamaguchi, M., Toriduka, H., Kobayashi, S., Sugawara, T., Hommaa, N., Satoh, A. and Aoki, T. (2010) Development of an On-Chip Micro Shielded-Loop Probe to Evaluate Performance of Magnetic Film to Protect a Cryptographic LSI from Electromagnetic Analysis. 2010 IEEE International Symposium on Electromagnetic Compatibility, Fort Lauderdale, 25-30 July 2010, 103-108.
https://doi.org/10.1109/ISEMC.2010.5711255
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