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Bisla, D., Choromanska, A., Stein, J.A., Polsky, D. and Berman, R. (2019) Towards Automated Melanoma Detection with Deep Learning: Data Purification and Augmentation. 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), Long Beach, 16-17 June 2019, 2720-2728.
http://arxiv.org/abs/1902.06061

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