Article citationsMore>>

Jeong, M.K., Lu, J.C., Huo, X., Vidakovic, B. and Chen, D. (2006) Wavelet-Based Data Reduction Techniques for Process Fault Detection. Technometrics, 48, 26-40.
https://doi.org/10.1198/004017005000000553

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top