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https://doi.org/10.1080/01411590290020448

has been cited by the following article:

• TITLE: Depth Profile Study of Electroless Deposited Sb2S3 Thin Films Using XPS for Photovoltaic Applications

  AUTHORS: Towhid Adnan Chowdhury

  KEYWORDS: Sb2S3, Depth Profiling, X-Ray Photoelectron Spectroscopy, Thin Film, Electroless

  JOURNAL NAME: Materials Sciences and Applications, Vol.14 No.7, July 19, 2023

  ABSTRACT: Sb2S3 has gained tremendous research recently for thin film solar cell absorber material because of their easy synthesis, unique electrical and optical properties. The stoichiometry and composition of electroless Sb2S3 thin films were analyzed using XPS depth profile studies. The surface layers were found nearly stoichiometric. On the other hand, the inner layer was rich in antimony composition making it more conductive electrically.