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B. Minnich, H. Leeb, E. W. N. Bernroider and A. Lamerschwandtner, “Three-Dimensional Morphometry in Scanning Electron Microscopy: A Technique for Accurate Dimensional And Angular Measurements of Microstructures Using Stereopaired Digitized Images and Digital Image Analysis,” Journal of Microscopy, Vol. 195, No. 1, 1999, pp. 23-33. doi:10.1046/j.1365-2818.1999.00478.x

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