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Zhang, D., Wang, F., Burgos, R., Kern, J., El-Barbari, S. and Boroyevich, D. (2009) Internal Fault Detection and Isolation for Paralleled Voltage Source Converters. 2009 Twenty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition, Washington DC, 15-19 February 2009, 833-839. https://doi.org/10.1109/APEC.2009.4802758

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