TITLE:
Investigation of the Boriding Process of the Ti-Al Intermetallic Alloy GE48-2-2 Taking into Account the Probability of the Influence of the Substrate Modification
AUTHORS:
Dimitrios I. Zagkliveris, Georgios K. Triantafyllidis
KEYWORDS:
Titanium Aluminide, Boriding, Titanium Boride, Substrate Modification, Phase Analysis, X-Ray Diffraction
JOURNAL NAME:
Materials Sciences and Applications,
Vol.9 No.11,
October
26,
2018
ABSTRACT: Boriding
of the Ti-Al intermetallic GE48-2-2 at 1273 K for 10 hours was performed. In
order to ensure that no any serious alteration occurred in the substrate, it
was previously examined with X-Ray Diffractometry (XRD), after it has undergone
an annealing process at the temperature of boronizing. Subsequently, we
examined the coating with XRD and Scanning Electron Microscopy, in order to
characterize its structure and morphology. A dense TiΒ2 layer,
10 - 15 μm thick, was
formed, but also Cr2B3 and NbN, BN and some Ti-Al phases
were detected. Efforts were undertaken to focus on influence of the substrate
modification, towards the quality of the coating.