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D. R. P. Singh, N. Chawla, and Y.-L. Shen, “Focused Ion Beam (FIB) Tomography of Nanoindentation Damage in Nanoscale Metal/Ceramic Multilayers,” Materials Characterization, Vol. 61, No. 4, 2010, pp. 481-488. doi:10.1016/j.matchar.2010.01.005

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